CAF commonly occurs between adjacent
vias (i.e. plated
through holes) inside a PCB, as the copper migrates along the glass/resin interface from
anode to
cathode. CAF failures can manifest as current leakage, intermittent
electrical shorts, and even
dielectric breakdown between conductors in printed circuit boards. This often makes CAF very difficult to detect, especially when it occurs as an intermittent issue. There are a few things that can be done to isolate the fault location and confirm CAF as a root cause of a failure. If the issue is intermittent then putting the sample of interest under combined temperature-humidity-bias (THB) may help recreate the failure mode. In addition, techniques such as
cross sectioning or
superconducting quantum interference device (SQUID) can be used to identify the failure. ==Considerations and mitigation==