Compared to other inelastic scattering techniques as
INS,
IXS, EELS or
Raman scattering that present shortcomings, RIXS has a number of unique features: it covers a large scattering phase-space thanks to the high energy photons, it is polarization dependent, element specific, bulk sensitive and requires only small sample volumes enabling studies on thin films as well as diluted solutions. RIXS is a resonant technique because the energy of the incident photon is chosen such that it coincides with, and hence resonates with, one of the atomic X-ray absorption edges of the system. The resonance greatly enhances the valence contribution to the inelastic scattering cross section, sometimes by many orders of magnitude. Comparing the energy of a neutron, electron or photon with a wavelength of the order of the relevant length scale in a solid - as given by the
de Broglie equation considering the interatomic lattice spacing is in the order of
Ångströms - it derives from the relativistic
energy–momentum relation that an X-ray photon has more energy than a neutron or electron. The scattering phase space (the range of energies and momenta that can be transferred in a scattering event) of X-rays is therefore without equal. In particular,
high-energy X-rays carry a momentum that is comparable to the inverse lattice spacing of typical condensed matter systems so that, unlike Raman scattering experiments with visible or infrared light, RIXS can probe the full dispersion of low energy excitations in solids. RIXS can utilize the
polarization of the photon: the nature of the excitations created in the material can be disentangled by a polarization analysis of the incident and scattered photons, which allow one, through the use of various selection rules, to characterize the symmetry and nature of the excitations. RIXS is
element specific: chemical sensitivity arises by tuning to the absorption edges of the different types of elements in a material. RIXS can even differentiate between the same chemical element at sites with different valencies or at inequivalent crystallographic positions as long as the X-ray absorption edges in these cases are distinguishable. In addition, the type of information on the electronic excitations of a system being probed can be varied by tuning to different X-ray edges (e.g., K, L or M) of the same chemical element, where the photon excites core-electrons into different valence orbitals. RIXS is
bulk sensitive: the penetration depth of resonant X-ray photons depends on the material and on the scattering geometry, but typically is of the order of a few micrometers in the hard X-rays regime (for example at transition metal
K-edges) and on the order of 0.1 micrometers in the soft X-ray regime (e.g. transition
metal L-edges). RIXS needs only
small sample volumes: the photon-matter interaction is relatively strong, compared to for instance to the neutron-matter interaction strength. This makes RIXS feasible on very small volume samples, thin films, surfaces and nano-objects, in addition to bulk single crystal, powder samples or diluted solutions. == RIXS spectral features ==