There are strong links between
quantum metrology and
quantum information science. For a multiparticle system of N spin-1/2 particles :F_{\rm Q}[\varrho, J_z] \le N holds for separable states, where : J_z=\sum_{n=1}^N j_z^{(n)}, and j_z^{(n)} is a single particle
angular momentum component. The maximum for general quantum states is given by :F_{\rm Q}[\varrho, J_z] \le N^2. Hence,
quantum entanglement is needed to reach the maximum precision in quantum metrology. Moreover, for quantum states with an
entanglement depth k, :F_{\rm Q}[\varrho, J_z] \le sk^2 + r^{2} holds, where s=\lfloor N/k \rfloor is the largest integer smaller than or equal to N/k, and r=N-sk is the remainder from dividing N by k. Hence, a higher and higher levels of multipartite entanglement is needed to achieve a better and better accuracy in parameter estimation. It is possible to obtain a weaker but simpler bound :F_{\rm Q}[\varrho, J_z] \le Nk. Hence, a lower bound on the entanglement depth is obtained as :\frac{F_{\rm Q}[\varrho, J_z]}{N} \le k. A related concept is the
quantum metrological gain, which for a given Hamiltonian is defined as the ratio of the quantum Fisher information of a state and the maximum of the quantum Fisher information for the same Hamiltonian for separable states g_{\mathcal H}(\varrho)=\frac{\mathcal F_Q[\varrho,{\mathcal H}]}{\mathcal F_Q^{({\rm sep})}(\mathcal H)}, where the Hamiltonian is \mathcal H=h_1+h_2+...+h_N, and h_n acts on the
nth spin. The metrological gain is defined by an optimization over all local Hamiltonians as g(\varrho)=\max_{\mathcal H}g_{\mathcal H}(\varrho). ==Measuring the Fisher information==