The history of X-ray microscopy can be traced back to the early 20th century. After the German physicist
Röntgen discovered X-rays in 1895, scientists soon illuminated an object using an X-ray point source and captured the shadow images of the object with a resolution of several micrometers. In 1918, Einstein pointed out that the
refractive index for X-rays in most mediums should be just slightly greater than 1, which means that refractive optical parts would be difficult to use for X-ray applications. Early X-ray microscopes by
Paul Kirkpatrick and
Albert Baez used
grazing-incidence reflective
X-ray optics to focus the X-rays, which grazed X-rays off
parabolic curved mirrors at a very high
angle of incidence. An alternative method of focusing X-rays is to use a tiny
Fresnel zone plate of concentric gold or nickel rings on a
silicon dioxide substrate. Sir
Lawrence Bragg produced some of the first usable X-ray images with his apparatus in the late 1940s. uses a "hohlraum" irradiated with laser beam cones from either side on its inner surface to bathe a fusion microcapsule inside with smooth high-intensity X-rays. The highest-energy X-rays that penetrate the hohlraum can be visualized using an X-ray microscope such as here, where X-radiation is represented in orange/red. In the 1950s
Sterling Newberry produced a shadow X-ray microscope, which placed the specimen between the source and a target plate, this became the basis for the first commercial X-ray microscopes from the
General Electric Company. After a silent period in the 1960s, X-ray microscopy regained people's attention in the 1970s. In 1972,
Horowitz and Howell built the first synchrotron-based X-ray microscope at the Cambridge Electron Accelerator. This microscope scanned samples using
synchrotron radiation from a tiny pinhole and showed the abilities of both transmission and fluorescence microscopy. Other developments in this period include the first holographic demonstration by
Sadao Aoki and
Seishi Kikuta in Japan, the first TXMs using zone plates by Schmahl et al., and Stony Brook's experiments in
STXM. The uses of synchrotron light sources brought new possibilities for X-ray microscopy in the 1980s. However, as new synchrotron-source-based microscopes were built in many groups, people realized that it was difficult to perform such experiments due to insufficient technological capabilities at that time, such as poor coherent illuminations, poor-quality x-ray optical elements, and user-unfriendly light sources. Entering the 1990s, new instruments and new light sources greatly fueled the improvement of X-ray microscopy. Microscopy methods including tomography, cryo-, and cryo-tomography were successfully demonstrated. With rapid development, X-ray microscopy found new applications in soil science, geochemistry, polymer sciences, and magnetism. The hardware was also miniaturized, so that researchers could perform experiments in their own laboratories. With the applications continuing to grow, X-ray microscopy has become a routine, proven technique used in environmental and soil sciences, geo- and cosmo-chemistry, polymer sciences, biology, magnetism, material sciences. With this increasing demand for X-ray microscopy in these fields, microscopes based on synchrotron, liquid-metal anode, and other laboratory light sources are being built around the world. X-ray optics and components are also being commercialized rapidly. ==Instrumentation==